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 | Simulations
Harold Simulations
A HAROLD device simulation consists of solving the governing equations of the model at a set of bias currents, so as to obtain the characteristics of the device vs. current.
 
HAROLD has a number of simulation modes to choose from:
 
			
			Running mode
			1D: Solves self-consistently the various differential equations of the model in the vertical (y) direction only, assuming uniformity on the longitudinal (z) direction.
			
			2D (XY, option): as above but models variations 
			of electrical and optical fields in both transverse directions.
			2D (YZ): Solves self-consistently same equations as in 1D mode but also considers longitudinal effects such as surface recombination and optical absorption at facets, and the non-uniformity of the optical field.
			PICWave Model:  a variation of the 1D isothermal model, this mode is used for producing material gain models which can be exported to PICWave. 
			
			Execution mode
			Isothermal: Simulates the device under “pulsed” operation i.e. ignores heating such that the temperature is fixed at a constant value throughout the whole structure. 
			
			Self-heating: Simulates the device under “CW” operation i.e. accounts for device heating model the heatflow within the device
			
			Test: A quick diagnostic mode which simulates the device at zero bias - it allows you examine basic results so you check that your layer structure has been set up as intended. 
Simulation ResultsDue to its detailed physical model, HAROLD can obtain a wide range of simulation results, including:
 
			
			1D/2D Results (i.e. 
			vertical/vertical-longitudinal profiles):
			Electrostatic potential, electric field
			Electron and hole Fermi energies 
			Conduction and valence band edges 
			Electron and hole densities (in bulk and QWs) 
			Electron and hole current densities 
			Recombination rates: SRH, Auger, spontaneous 
			emission, stimulated 
			Heat flow and temperature profiles, profiles of 
			different heat sources (Joule effect, non-radiative recombination, free-carrier absorption)
			 
		 
 (left) Alignment of electron and hole Fermi energies with conduction and valence bands in
 InGaAsP 1.55µm 6QW epi-structure and (right) profile of confined and unconfined electron and
 hole densities in same structure – vertical leakage of unconfined carriers through QWs can be seen
 
			
			Per-bias Results (i.e. vs. bias current/voltage/current density):
			
			Optical powers for left and right-hand facets (optical output power, scattered and absorbed power)
			Dissipated power due to Joule heating, non-radiative 
			recombination, free carrier absorption
			External slope efficiency for both facets (dP/dI)
			Electron and hole densities (in bulk and QWs)
			Active region temperature
			Quantum efficiency
			Lasing wavelength
			Modal and material gain
			Effective mode index change
			Free carrier loss
			Recombination rates (in bulk and QWs): SRH, Auger, spontaneous emission, stimulated
 
		 
 (left) LI curves for self-heating laser diode simulation for ambient temperatures 0C to 100C
 and (right) recombination rates for 50C ambient temperature simulation –
 the rising Auger contributes to the thermal roll-over in the LI curve
 
			
			Spectra:
			Gain 
			Spontaneous emission
			Refractive index 
		 
 Gain (left) and spontaneous emission (right) spectra for the set of simulated biases (isothermal simulation)
 
			
			Quantum well results:
			Electron, light-hole, heavy-hole potentials
			QQW wavefunctions and energy eigenvalues for electron, light-hole and heavy-hole sub-bands
 
		 
 Wavefunction of the lowest energy electron state in a 6 QW structure
 
		  
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