Introduction
Features
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Model Details
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Interface
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Simulations
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XY Laser Module
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VCSEL Module
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Harold QCSE
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Simulations
Harold Simulations
A HAROLD device simulation consists of solving the governing equations of the model at a set of bias currents, so as to obtain the characteristics of the device vs. current.
HAROLD has a number of simulation modes to choose from:
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Running mode
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1D: Solves self-consistently the various differential equations of the model in the vertical (y) direction only, assuming uniformity on the longitudinal (z) direction.
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2D (XY, option): as above but models variations
of electrical and optical fields in both transverse directions.
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2D (YZ): Solves self-consistently same equations as in 1D mode but also considers longitudinal effects such as surface recombination and optical absorption at facets, and the non-uniformity of the optical field.
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PICWave Model: a variation of the 1D isothermal model, this mode is used for producing material gain models which can be exported to PICWave.
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Execution mode
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Isothermal: Simulates the device under “pulsed” operation i.e. ignores heating such that the temperature is fixed at a constant value throughout the whole structure.
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Self-heating: Simulates the device under “CW” operation i.e. accounts for device heating model the heatflow within the device
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Test: A quick diagnostic mode which simulates the device at zero bias - it allows you examine basic results so you check that your layer structure has been set up as intended.
Simulation Results
Due to its detailed physical model, HAROLD can obtain a wide range of simulation results, including:
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1D/2D Results (i.e.
vertical/vertical-longitudinal profiles):
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Electrostatic potential, electric field
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Electron and hole Fermi energies
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Conduction and valence band edges
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Electron and hole densities (in bulk and QWs)
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Electron and hole current densities
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Recombination rates: SRH, Auger, spontaneous
emission, stimulated
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Heat flow and temperature profiles, profiles of
different heat sources (Joule effect, non-radiative recombination, free-carrier absorption)
(left) Alignment of electron and hole Fermi energies with conduction and valence bands in
InGaAsP 1.55µm 6QW epi-structure and (right) profile of confined and unconfined electron and
hole densities in same structure – vertical leakage of unconfined carriers through QWs can be seen
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Per-bias Results (i.e. vs. bias current/voltage/current density):
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Optical powers for left and right-hand facets (optical output power, scattered and absorbed power)
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Dissipated power due to Joule heating, non-radiative
recombination, free carrier absorption
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External slope efficiency for both facets (dP/dI)
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Electron and hole densities (in bulk and QWs)
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Active region temperature
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Quantum efficiency
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Lasing wavelength
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Modal and material gain
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Effective mode index change
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Free carrier loss
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Recombination rates (in bulk and QWs): SRH, Auger, spontaneous emission, stimulated
(left) LI curves for self-heating laser diode simulation for ambient temperatures 0C to 100C
and (right) recombination rates for 50C ambient temperature simulation –
the rising Auger contributes to the thermal roll-over in the LI curve
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Spectra:
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Gain
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Spontaneous emission
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Refractive index
Gain (left) and spontaneous emission (right) spectra for the set of simulated biases (isothermal simulation)
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Quantum well results:
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Electron, light-hole, heavy-hole potentials
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QQW wavefunctions and energy eigenvalues for electron, light-hole and heavy-hole sub-bands
Wavefunction of the lowest energy electron state in a 6 QW structure
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